CMOS VLSI Design: A Circuits and Systems Perspective - Couverture rigide

David Money Harris Associate Professor of Engineering at Harvey Mudd College in Claremont, CA, holds a Ph.D. from Stanford University and S.B. and M.Eng. degrees from MIT. His research interests include CMOS VLSI design, microprocessors, and computer arithmetic. He holds a dozen patents, is the author of three other books in the field of digital design and three hiking guidebooks, and has designed chips at Sun Microsystems, Intel, Hewlett-Packard, and Evans & Sutherland. 

Neil Weste is a member of the faculty at the Department of Electronic Engineering, Macquarie University; Adjunct Professor of Electrical Engineering at The University of Adelaide; and Director, Engineering at Cisco’s Wireless Networking Business Unit. He is a Fellow of the IEEE for his contributions to custom IC design, and a peer elected member of the IEEE Solid State Circuits Society. In 1997 he cofounded Radiata Communications (with David Skellern) which designed the first chip sets for the IEEE 802.11a WLAN standard; in 2001 Radiata was acquired by Cisco. He has served as department head at Bell Laboratories; leader of design projects for Symbolics, Inc.; and as president of TLW, Inc., an IC engineering company that completed groundbreaking chip designs for companies such as North American Philips, Analog Devices, AT&T Microelectronics and Thomson Consumer Electronics. 

For both introductory and advanced courses in VLSI design, this authoritative, comprehensive textbook is highly accessible to beginners, yet offers unparalleled breadth and depth for more experienced readers.

The Fourth Edition of CMOS VLSI Design: A Circuits and Systems perspective presents broad and in-depth coverage of the entire field of modern CMOS VLSI Design. The authors draw upon extensive industry and classroom experience to introduce today’s most advanced and effective chip design practices. They present extensively updated coverage of every key element of VLSI design, and illuminate the latest design challenges with 65 nm process examples. This book contains unsurpassed circuit-level coverage, as well as a rich set of problems and worked examples that provide deep practical insight to readers at all levels.